Table of Contents

GTI Research Report on Universal Testing Methodology for Ambient-IoT Devices —Research on Building a Testing and Certification System for the Ambient-IoT Devices 2

Document History 3

Table of Contents 5

1 Executive Summary 7

2 Abbreviations 7

3 Introduction 9

3.1 Research Background 9

3.2 Research Purpose and Significance 11

3.2.1 Research Purpose 11

3.2.2 Research Significance 12

3.3 Research Content and Technical Route 13

3.3.1 Research Content 13

3.3.2 Technical Route 14

4 Survey of Existing RFID device Certification Systems and Production Line Testing Status 16

4.1 Analysis of Mainstream RFID device Certification Systems 16

4.1.1 Protocol Conformance Testing and Certification 17

4.1.2 device Performance Testing and Certification 21

4.2 RFID device Production Line Testing Process and Quality Control Mechanism 26

4.2.1 Core Objectives of device Production Line Testing 26

4.2.2 Full-Process device Production Line Testing 27

4.2.3 device Production Line Special Quality Control Mechanisms 28

4.3 RFID Chip Production Line Testing Process and Quality Control Mechanism 29

4.3.1 Core Objectives of Chip Production Line Testing 29

4.3.2 Full-Process Chip Production Line Testing 30

4.3.3 Chip Production Line Special Quality Control Mechanisms 31

4.4 Analysis of Pain Points in Ambient IoT device Testing and Certification 32

5 Ambient IoT Testing and Certification System Construction Research 33

5.1 Ambient IoT Technical Characteristics and Ecosystem Needs 33

5.1.1 Definition 33

5.1.2 Core Characteristics 35

5.1.3 Typical Scenarios 36

5.2 Necessity of Ambient IoT Certification System Construction 38

5.2.1 Ensuring Interoperability and Compatibility of Ambient IoT 38

5.2.2 Improving device Stability and Reliability in Real Complex Environments 39

5.2.3 Establishing Industry Trust Mechanisms, Providing Reliable Certification Endorsements for Governments, Enterprises, and Financial Institutions 40

5.3 Ambient IoT Certification System Framework Design 41

5.3.1 Core Concepts 42

5.3.2 Certification Levels 42

5.3.3 Certification Process Design 47

5.3.4 Technical Support Platform Construction Concept 48

5.4 Construction of "Chip-Device-Application" 3-tier Testing and Certification System 49

5.4.1 System Separation Principles and Case Rules 50

5.4.2 Chip-Level Certification Test Cases (C Series) 54

5.4.3 Device-Level Certification Test Cases (D Series) 54

5.4.4 Application-Level Certification Test Cases (A Series) 55

5.5 Coordination Mechanisms for Testing Specification Development 59

6 Construction of Application Scenario-Driven Testing Requirements System 61

6.1 Typical Application Scenario Characteristics of 5G Ambient IoT 61

6.1.1 General Scenario Characteristics 61

6.1.2 Typical Industry Application Scenarios 62

6.2 Application Scenario-Oriented Testing Specification Design 64

7 Conclusions and Recommendations 65

7.1 Main Research Conclusions 65

7.2 Future Outlook 66

8 References 66